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Scanning near-field optical spectroscopy and imaging using nanofabricated probes

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5 Author(s)
Zhou, H. ; Department of Electronics and Electrical Engineering, Glasgow University, Glasgow G12 8QQ, United Kingdom ; Midha, A. ; Mills, G. ; Donaldson, L.
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We have designed and constructed a scanning near-field optical microscopy (SNOM) system which is based on batch-fabricated aperture probes fabricated using micromachining and direct-write electron-beam lithography. The aperture is situated at the hollow tip apex of a modified silicon nitride atomic force microscope (AFM) cantilever. The SNOM/AFM probes are used both for excitation and collection of luminescence due to their excellent optical efficiency. The integration of a cantilever with the aperture allows better control of the aperture–sample distance and also results in considerable simplification of the SNOM system. Using this system, we have obtained near-field luminescence spectra and imaging of GaAs/AlGaAs quantum wires and wells, and have demonstrated spectrally resolved luminescence imaging with a spatial resolution of ∼50 nm. © 1999 American Institute of Physics.

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Applied Physics Letters  (Volume:75 ,  Issue: 13 )