Cart (Loading....) | Create Account
Close category search window
 

Atomic steps with tuning-fork-based noncontact atomic force microscopy

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Rensen, W.H.J. ; Applied Optics Group, University of Twente, P.O. Box 217, 7500AE Enschede, The Netherlands ; van Hulst, N.F. ; Ruiter, A.G.T. ; West, P.E.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.124780 

Tuning forks as tip–sample distance detectors are a promising and versatile alternative to conventional cantilevers with optical beam deflection in noncontact atomic force microscopy (AFM). Both theory and experiments are presented to make a comparison between conventional and tuning-fork-based AFM. Measurements made on a Si(111) sample show that both techniques are capable of detecting monatomic steps. The measured step height of 0.33 nm is in agreement with the accepted value of 0.314 nm. According to a simple model, interaction forces of 30 pN are obtained for the tuning-fork-based setup, indicating that, at the proper experimental conditions, the sensitivity of such an instrument is competitive to conventional lever-based AFM. © 1999 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:75 ,  Issue: 11 )

Date of Publication:

Sep 1999

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.