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Micromagnetic and experimental studies of CoPtCr polycrystalline thin film media with bicrystal microstructure

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8 Author(s)
Qingzhi Peng ; Center for Magnetic Recording Res., California Univ., San Diego, La Jolla, CA, USA ; Bertram, H.N. ; Fussing, N. ; Doerner, M.
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Polycrystalline CoPtCr/CrV (or Cr) thin films with different Cr concentrations were prepared by sputter deposition on NiP-plated Al substrates. TEM images revealed the existence of bicrystal clusters. High field torque measurement was used to determine the intrinsic anisotropy constant. The M-H loop and torque hysteresis measurement coupled with micromagnetic modeling permitted determination of intergranular interactions. The cross-track correlation length was evaluated from micromagnetic noise calculation and compared well with the result from measured noise spectra. The physical implication of a bicrystal structure is discussed in general

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Magnetics, IEEE Transactions on  (Volume:31 ,  Issue: 6 )