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Browse Journals & Magazines > Applied Physics Letters ...> Volume:75 Issue:10 Help

Atomic force microscopy phase imaging of conductive polymer blends with ultralow percolation threshold

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3 Author(s)
Planes, Jerome ; Département de Recherche Fondamentale sur la Matière condensée, CEA-Grenoble, 17 rue des Martyrs, F-38054 Grenoble Cedex 9, France ; Samson, Yves ; Cheguettine, Yasmina

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.124705 

Tapping-mode atomic force microscopy is used to image the conducting network of polyaniline inside organic blends. The greater stiffness of the conducting polymer phase with respect to the matrix leads to good resolution phase contrast imaging. Cross-section images provide a unique insight in the distribution of the conductive phase within the matrix. © 1999 American Institute of Physics.

Published in:
Applied Physics Letters  (Volume:75 ,  Issue: 10 )

Date of Publication: Sep 1999

Page(s):
1395 - 1397
ISSN :
0003-6951
Digital Object Identifier :
10.1063/1.124705
Product Type:
Journals & Magazines
Date of Current Version :
18 June 2009
Issue Date :
Sep 1999

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