Close category search window
 

Theoretical modeling of carrier and lattice heating effects for frequency chirping in semiconductor lasers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Tsai, Chin-Yi ; Department of Electronic and Electrical Engineering, De Montfort University, Leicester LE1 9BH, United Kingdom ; Chen, Chih-Hsiung ; Sung, Tien-Li ; Tsai, Chin-Yao
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.123409 

A theoretical model is presented that is capable of simultaneously simulating the frequency response of the photon density, carrier density, electron temperature, hole temperature, populations of nonequilibrium longitudinal optical (LO) and transverse optical (TO) phonons at different wave vectors, and lattice temperature under the modulation of small-signal current. Our results not only provide a more consistent theoretical model for frequency chirping but also illustrate the different roles of carrier and lattice heating in the frequency response of semiconductor lasers. © 1999 American Institute of Physics.

Published in:
Applied Physics Letters  (Volume:74 ,  Issue: 7 )

Date of Publication: Feb 1999

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.