Cart (Loading....) | Create Account
Close category search window

Finite-element modeling of diamond deformation at multimegabar pressures

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Merkel, Sebastien ; Geophysical Laboratory and Center for High Pressure Research, Carnegie Institution of Washington, 5251 Broad Branch Road, N.W., Washington, DC 20015 ; Hemley, R.J. ; Ho-kwang Mao

Your organization might have access to this article on the publisher's site. To check, click on this link: 

Finite-element modeling calculations reveal the origin of the remarkably large elastic strains in diamond observed in recent experiments at multimegabar pressures. This approach provides a means to determine the pressure dependence of the yield strength of strong materials used in the gasket, and allows us to examine quantities that are not accessible experimentally such as the stress and strain relations in diamond. Stress tensor elements are obtained near the tip where large modifications in the optical properties of diamond have been observed. © 1999 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:74 ,  Issue: 5 )

Date of Publication:

Feb 1999

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.