The use of SrTiO3 films in cryogenic high-frequency applications has been limited by the low dielectric constant Єr of thin films (≈103) when compared to the bulk value of over 104. We show that the extension of the pulsed laser deposition technique to temperatures well above 1000 °C, coupled with in situ reflection high energy electron diffraction monitoring, makes it possible to grow SrTiO3 films in the step-flow mode. Films grown in this mode showed at 4.2 K a maximum Єr of 12 700, which could be tuned by 80% by applying a bias voltage of ±1 V. © 1999 American Institute of Physics.
Published in:
Applied Physics Letters
(Volume:74
,
Issue:
23
)
Date of Publication:
Jun 1999
- Page(s):
-
3543
-
3545
- ISSN :
-
0003-6951
- Digital Object Identifier :
-
10.1063/1.124155
- Product Type:
-
Journals & Magazines
- Date of Current Version :
-
18 June 2009
- Issue Date :
-
Jun 1999