Cart (Loading....) | Create Account
Close category search window
 

Experimental demonstration of a binary wire for quantum-dot cellular automata

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Orlov, A.O. ; Department of Electrical Engineering, University of Notre Dame, Indiana 46556 ; Amlani, I. ; Toth, G. ; Lent, C.S.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.124043 

Experimental studies are presented of a binary wire based on the quantum-dot cellular automata computational paradigm. The binary wire consists of capacitively coupled double-dot cells charged with single electrons. The polarization switch caused by an applied input signal in one cell leads to the change in polarization of the adjacent cell and so on down the line, as in falling dominos. Wire polarization was measured using single islands as electrometers. Experimental results are in very good agreement with the theory and confirm there are no metastable states in the wire. © 1999 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:74 ,  Issue: 19 )

Date of Publication:

May 1999

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.