The dielectric response of epitaxial BaTiO3 thin films deposited on MgO was measured through surface electrodes as a function of applied bias, frequency, and temperature. The room temperature value of the dielectric constant was ∼500 with a dissipation factor, tan(δ), of 0.05 at 100 kHz. Measurements varying the bias field showed hysteresis of the dielectric response and a tunability of 30% for a maximum applied field of ∼7 MV/m. The frequency response of the dielectric constant is well described by a Curie–von Schweidler power law with an exponent ∼0.04 in the range 1 kHz–13 MHz. The films undergo a diffuse phase transition at temperatures higher than the bulk Curie temperature. The behavior of the dielectric response is attributed to the presence of residual strain in the epitaxial thin films. © 1998 American Institute of Physics.
Published in:
Applied Physics Letters
(Volume:73
,
Issue:
16
)
Date of Publication:
Oct 1998
- Page(s):
-
2248
-
2250
- ISSN :
-
0003-6951
- Digital Object Identifier :
-
10.1063/1.121691
- Product Type:
-
Journals & Magazines
- Date of Current Version :
-
18 June 2009
- Issue Date :
-
Oct 1998