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Thermal degradation of exchange biased films in spin-valves

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3 Author(s)
McMichael, R.D. ; Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA ; Egelhoff, W.F. ; Bennett, L.H.

As part of an investigation of the thermal stability of spin valve structures, ferromagnetic resonance (FMR) and SQUID magnetometry measurements were made on an exchange biased film, Cu50Ni50/13.1Cu 2.0/Co 2.1/Ni80Fe20/2.7Fe50Mn50/9.2 Cu 2.4 nm, as a function of annealing temperature up to 550°C. The measurements show an enhancement in the exchange bias surface energy for annealing temperatures above 250°C accompanied by increased FMR linewidth and reduced geff which are attributed to increased inhomogeneity of the exchange anisotropy. At temperatures as low as 200°C, annealing produces large increases in moment per unit area which are indicative of diffusion

Published in:

Magnetics, IEEE Transactions on  (Volume:31 ,  Issue: 6 )

Date of Publication:

Nov 1995

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