By Topic

Thermal degradation of exchange biased films in spin-valves

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
McMichael, R.D. ; Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA ; Egelhoff, W.F. ; Bennett, L.H.

As part of an investigation of the thermal stability of spin valve structures, ferromagnetic resonance (FMR) and SQUID magnetometry measurements were made on an exchange biased film, Cu50Ni50/13.1Cu 2.0/Co 2.1/Ni80Fe20/2.7Fe50Mn50/9.2 Cu 2.4 nm, as a function of annealing temperature up to 550°C. The measurements show an enhancement in the exchange bias surface energy for annealing temperatures above 250°C accompanied by increased FMR linewidth and reduced geff which are attributed to increased inhomogeneity of the exchange anisotropy. At temperatures as low as 200°C, annealing produces large increases in moment per unit area which are indicative of diffusion

Published in:

Magnetics, IEEE Transactions on  (Volume:31 ,  Issue: 6 )