By Topic

Phase noise of a resonant-tunneling relaxation oscillator

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Verghese, S. ; Lincoln Laboratory, Massachusetts Institute of Technology, Lexington, Massachusetts 02173-9108 ; Parker, C.D. ; Brown, E.R.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.121414 

Experimental results are presented for the phase noise of a relaxation oscillator consisting of a resonant-tunneling diode in series connection with a transmission line, one end of which is shorted. Unlike constant-wave negative-resistance oscillators, the resonant-tunneling relaxation oscillator (RTRO) emits a sequence of sharp current pulses that are mode locked to the fundamental mode of the cavity formed by the short-circuited transmission line. The phase noise in the RTRO was investigated with and without injection locking by a weak sinusoidal source. Injection-locking gain of 51 dB was measured for fundamental injection locking. Subharmonic injection locking was demonstrated out to the 12th subharmonic. Also, timing jitter as low as 200 fs was measured for an RTRO that emitted ∼ 30 ps pulses at a repetition rate of 1.1 GHz. © 1998 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:72 ,  Issue: 20 )