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Local optical spectroscopy of self-assembled quantum dots using a near-field optical fiber probe to induce a localized strain field

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4 Author(s)
Robinson, H.D. ; Department of Physics, Boston University, Boston, Massachusetts 02215 ; Muller, M.G. ; Goldberg, B.B. ; Merz, J.L.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.121282 

We introduce and demonstrate a novel operating mode in near-field optical microscopy. The tip is used to simultaneously optically probe the sample and induce a highly localized strain in the area under study by pushing the tip into the sample. From knowledge of total tip-sample compression and tip geometry, we estimate the magnitude of stress, and show that localized uniaxial-like stresses in excess of 10 kbar can be achieved. We apply this method to a sample of InAlAs self-assembled quantum dots. A blueshift of quantum dot emission lines consistent with estimates of the strain is observed, as well as a quenching of the photoluminescence with strain. © 1998 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:72 ,  Issue: 17 )

Date of Publication:

Apr 1998

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