By Topic

Enhanced thermodynamic stability of tetragonal-phase field in epitaxial Pb(Zr,Ti)O3 thin films under a two-dimensional compressive stress

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
2 Author(s)
Oh, S.Hoon ; Department of Materials Science and Engineering, and Laboratory for Physics/Chemistry of Dielectric Materials, Pohang University of Science and Technology (POSTECH), Pohang 790-784, Korea ; Jang, Hyun M.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.120609 

A two-dimensional thermodynamic model was developed to account for the observed difficulty in the fabrication of epitaxial Pb(Zr,Ti)O3 (PZT) thin films in which tetragonal and rhombohedral phases coexist. The thermodynamic formalism based on the Landau–Devonshire’s phenomenological theory predicts the enhanced thermodynamic stability of the tetragonal-phase field under a two-dimensional compressive stress. We have experimentally proved this prediction by fabricating an epitaxially oriented tetragonal PZT thin film on MgO substrate with the target composition corresponding to the bulk morphotropic phase boundary (MPB). © 1998 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:72 ,  Issue: 12 )