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Dichroic Bragg reflectors based on birefringent porous silicon

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7 Author(s)
Diener, J. ; Technische Universität München, Physik-Department E16, D-85747 Garching, Germany ; Kunzner, N. ; Kovalev, D. ; Gross, E.
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Multilayers of anisotropically nanostructured silicon (Si) have been fabricated and studied by polarization-resolved reflection measurements. Alternating layers having different refractive indices exhibit additionally a strong in-plane anisotropy of their refractive index (birefringence). Therefore, a stack of layers, acting as a distributed Bragg reflector, has two distinct reflection bands, depending on the polarization of the incident linearly polarized light. This effect is governed by a three-dimensional (in-plane and in-depth) variation of the refractive index. These structures can yield optical effects which are difficult to achieve with conventional Bragg reflectors. © 2001 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:78 ,  Issue: 24 )

Date of Publication:

Jun 2001

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