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Noise current analysis, both in time and frequency, is proposed as a means to sense variations of the microscopic conduction in organic light emitting diodes and to track their time evolution. The sensitivity of the technique would allow to correlate the carriers conduction properties with the corresponding changes in the microscopic morphology of the organic layers as obtained with structural or spectroscopic investigations. The method is shown to be very effective also in sensing the initial state and the growth of organic diodes catastrophic degradation in large advance to current monitoring or other techniques. © 2001 American Institute of Physics.