Referenced Items are not available for this document.
Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1374516
Noise current analysis, both in time and frequency, is proposed as a means to sense variations of the microscopic conduction in organic light emitting diodes and to track their time evolution. The sensitivity of the technique would allow to correlate the carriers conduction properties with the corresponding changes in the microscopic morphology of the organic layers as obtained with structural or spectroscopic investigations. The method is shown to be very effective also in sensing the initial state and the growth of organic diodes catastrophic degradation in large advance to current monitoring or other techniques. © 2001 American Institute of Physics.
Published in:
Applied Physics Letters
(Volume:78
,
Issue:
21
)
Date of Publication: May 2001
- Page(s):
- 3262 - 3264
- ISSN :
- 0003-6951
- Digital Object Identifier :
- 10.1063/1.1374516
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 18 June 2009
- Issue Date :
- May 2001
About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies
A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.
