Cart (Loading....) | Create Account
Close category search window
 

Thermal stability of magnetic tunnel junctions studied by x-ray photoelectron spectroscopy

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Keavney, David J. ; Optical Sciences Center, The University of Arizona, Tucson, Arizona 85721 ; Park, Sungkyun ; Falco, Charles M. ; Slaughter, J.M.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1338957 

We have studied the evolution of chemical state of the metallic layers in NiFe/Al oxide/NiFe tunnel junction structures in as-deposited films and after postdeposition annealing. Both top and bottom NiFe layers in as-deposited films show significant Fe oxidation, but no Ni oxidation. This Fe is reduced in annealed samples, implying that oxygen migrates from the FeNi layers, possibly into the Al oxide layer. We also find that both top and bottom electrodes are significantly oxidized even in optimally annealed films. © 2001 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:78 ,  Issue: 2 )

Date of Publication:

Jan 2001

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.