Skip to Main Content
Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1371529
We have constructed a dual-probe scanning tunneling microscope (D-STM). We used multiwall carbon nanotubes [(NT), diameter: ∼10 nm] as STM probes. The D-STM allows us to elucidate the electric property of a sample with a spatial resolution of ∼1 nm. Using this system, we have measured the current–voltage curves of a single NT ring as a transistor. The curves show the possibility of nanometer-scale electronic circuits composed of NT devices. © 2001 American Institute of Physics.