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Dual-probe scanning tunneling microscope: Measuring a carbon nanotube ring transistor

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4 Author(s)
Watanabe, Hiroyuki ; Advanced Research Laboratory, Corporate Research Center, Fuji Xerox Company, Ltd., 1600, Takematsu, Minamiashigara-shi, Kanagawa-ken, 250-0111, Japan ; Manabe, Chikara ; Shigematsu, Taishi ; Shimizu, Masaaki

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We have constructed a dual-probe scanning tunneling microscope (D-STM). We used multiwall carbon nanotubes [(NT), diameter: ∼10 nm] as STM probes. The D-STM allows us to elucidate the electric property of a sample with a spatial resolution of ∼1 nm. Using this system, we have measured the current–voltage curves of a single NT ring as a transistor. The curves show the possibility of nanometer-scale electronic circuits composed of NT devices. © 2001 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:78 ,  Issue: 19 )