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Dielectric loss and defect mode of SrTiO3 thin films under direct-current bias

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6 Author(s)
Ang, Chen ; Materials Research Laboratory, The Pennsylvania State University, University Park, Pennsylvania 16802 ; Cross, L.E. ; Yu, Zhi ; Guo, Ruyan
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The dielectric behavior of SrTiO3 thin films prepared by the pulsed-laser deposition technique on SrTiO3 single-crystal substrates is studied under dc electric field. A high dielectric constant maximum εmax(∼2280) and a low-loss tan δ (∼0.001) are obtained. Compared with the observation in SrTiO3 single crystals, an additional dielectric loss peak with frequency dispersion is observed around 150 K (at 1 kHz). With increasing dc bias, the peak is suppressed and finally disappears at ∼350 kV/cm; however, the temperature at which the peak occurs is independent of electric field. The possible physical mechanism of the peak is briefly discussed. © 2001 American Institute of Physics.

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Applied Physics Letters  (Volume:78 ,  Issue: 18 )