Cart (Loading....) | Create Account
Close category search window

Young’s modulus measurements and grain boundary sliding in free-standing thin metal films

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Kalkman, A.J. ; Department of Applied Physics and DIMES, Delft University of Technology, Lorentzweg 1, 2628 CJ Delft, The Netherlands ; Verbruggen, A.H. ; Janssen, G.C.A.M.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

Young’s modulus of free-standing polycrystalline Al, Au, and W films with submicron thickness has been studied using a dynamic bulge-testing technique. For Au and Al films a clear frequency dependence of the modulus is observed at room temperature in the range 1×10-4–0.5 rad/s. The values of the moduli are considerably smaller than the corresponding values of bulk material. The modulus of W films measured under the same conditions does not depend on frequency and is equal to the bulk value. The origin of the behavior found in the Al and Au films is anelastic grain boundary sliding. As a consequence of the relatively small grain size of thin polycrystalline films this phenomenon is observable at room temperature in films with a relatively low melting point. © 2001 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:78 ,  Issue: 18 )

Date of Publication:

Apr 2001

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.