By Topic

Observation of current crowding near fabricated voids in gold lines

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
4 Author(s)
Yongsunthon, R. ; University of Maryland, College Park, Maryland 20740 ; Stanishevsky, A. ; McCoy, J. ; Williams, E.D.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1368190 

The spatial variation of current density in lines with model void defects fabricated using focused-ion beam milling has been imaged using magnetic force microscopy (MFM). At current densities of 3–4×106 A/cm2, an asymmetry in the MFM signal is clearly visible at (1×1) μm2 and (0.5×0.5) μm2 notches at the edge of a 10 μm wide line. Comparison to a simple model calculation suggests that the asymmetry is due to current crowding, with the displaced current 70% localized to within 1μm of the notch. © 2001 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:78 ,  Issue: 18 )