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Low-temperature scanning probe microscopy of surface and subsurface charges

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4 Author(s)
Vogel, Markus ; Center for NanoScience, Sektion Physik der Ludwig-Maximilians, Universitat München, Geschwister-Scholl-Platz 1, 80539, München, Germany ; Stein, Bernhard ; Pettersson, Hakan ; Karrai, Khaled

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1360780 

The operation of a cryogenic scanning force microscope is demonstrated with a sensitivity of about

50 fN/ Hz
at 5 kHz modulation. This microscope is used as an electrometer in noncontact mode in order to map the local electrostatic forces and capacitance of several nanostructures at 4.2 K. Capacitance imaging of nanostructured surfaces with subatto-Farad resolution is demonstrated. © 2001 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:78 ,  Issue: 17 )

Date of Publication:

Apr 2001

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