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Syndrome signature in output compaction for VLSI BIST

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4 Author(s)
Das, S.R. ; Dept. of Electr. Eng., Ottawa Univ., Ont., Canada ; Goel, N. ; Jone, W.B. ; Nayak, A.R.

An output compaction method, called syndrome signature, is proposed herein. It is particularly well-suited for exhaustive testing of VLSI circuits and is based on the idea originally developed by Savir for syndrome testing. A syndrome is the normalized number of 1's realized by a function under exhaustive application of all possible input patterns. Given an n-input combinational circuit, a syndrome signature is defined by an (n+1)-element vector consisting of the primary syndrome of the function F and n other subsyndromes corresponding to the subfunctions obtained by setting ith variable in F, equal to 0 or 1. A multiple output syndrome signature is also discussed, which preserves all the desirable properties of the conventional single-output circuit response analyzers. The proposed technique is implemented on various combinational circuits and the results look very promising

Published in:

VLSI Design, 1996. Proceedings., Ninth International Conference on

Date of Conference:

3-6 Jan 1996