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Resonance frequency and Q factor mapping by ultrasonic atomic force microscopy

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4 Author(s)
Yamanaka, Kazushi ; Department of Materials Processing, Tohoku University, Aoba 02, Sendai 980-8579, Japan ; Maruyama, Yoshiki ; Tsuji, Toshihiro ; Nakamoto, Keiichi

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We developed an improved ultrasonic atomic force microscopy (UAFM) for mapping resonance frequency and Q factor of a cantilever where the tip is in linear contact with the sample. Since the vibration amplitude at resonance is linearly proportional to the Q factor, the resonance frequency and Q factor are measured in the resonance tracking mode by scanning the sample in the constant force mode. This method enables much faster mapping of the resonance frequency and Q factor than the previous one using a network analyzer. In this letter, we describe the principle and instrumentation of the UAFM and show images of carbon-fiber-reinforced plastic composites. © 2001 American Institute of Physics.

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Applied Physics Letters  (Volume:78 ,  Issue: 13 )