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Browse Journals & Magazines > Applied Physics Letters ...> Volume:79 Issue:26 Help

Magnetic, structural, and transport properties of thin film and single crystal Co2MnSi

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9 Author(s)
Raphael, M.P. ; U.S. Naval Research Laboratory, Washington, DC 20375 ; Ravel, B. ; Willard, M.A. ; Cheng, S.F.
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Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1428625 

The magnetic, structural, and transport properties of the Heusler alloy Co2MnSi are reported for sputtered thin films and a single crystal. X-ray diffraction reveals a phase pure L21 structure for all films grown between 573 and 773 K. Films grown at 773 K display a four-fold decrease in the resistivity relative to those grown at lower temperatures and a corresponding 30% increase in the residual resistivity ratio (ρ300 K/ρ5 K). We show that the higher growth temperature results in lattice constants, room temperature resistivities, and magnetic properties that are comparable to that of the bulk single crystal. © 2001 American Institute of Physics.

Published in:
Applied Physics Letters  (Volume:79 ,  Issue: 26 )

Date of Publication: Dec 2001

Page(s):
4396 - 4398
ISSN :
0003-6951
Digital Object Identifier :
10.1063/1.1428625
Product Type:
Journals & Magazines
Date of Current Version :
18 June 2009
Issue Date :
Dec 2001

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