Cart (Loading....) | Create Account
Close category search window
 

Testing analogue circuits by AC power supply voltage

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
A'ain, A.K.B. ; Dept. of Eng., Lancaster Univ., UK ; Bratt, A.H. ; Dorey, A.P.

This paper discusses the application of power supply voltage control testing technique for analogue circuits. It compares the fault coverage of voltage level and supply current monitoring schemes and proposes a technique to expose defects in redundant circuits that are very difficult to expose using other testing techniques. It also discusses the effect in exposing defects by using different power supply frequency. Measurement and data analysis techniques to facilitate identification and classification between hard and soft defects is also proposed

Published in:

VLSI Design, 1996. Proceedings., Ninth International Conference on

Date of Conference:

3-6 Jan 1996

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.