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Testing analogue circuits by AC power supply voltage

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3 Author(s)
A'ain, A.K.B. ; Dept. of Eng., Lancaster Univ., UK ; Bratt, A.H. ; Dorey, A.P.

This paper discusses the application of power supply voltage control testing technique for analogue circuits. It compares the fault coverage of voltage level and supply current monitoring schemes and proposes a technique to expose defects in redundant circuits that are very difficult to expose using other testing techniques. It also discusses the effect in exposing defects by using different power supply frequency. Measurement and data analysis techniques to facilitate identification and classification between hard and soft defects is also proposed

Published in:

VLSI Design, 1996. Proceedings., Ninth International Conference on

Date of Conference:

3-6 Jan 1996

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