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Browse Journals & Magazines > Applied Physics Letters ...> Volume:79 Issue:21 Help

Magnetic nanoelements for magnetoelectronics made by focused-ion-beam milling

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4 Author(s)
Xiong, Gang ; Nanomagnetism Group, Department of Physics, University of Durham, Rochester Building, Science Laboratories, South Road, Durham DH1 3LE, United Kingdom ; Allwood, D.A. ; Cooke, M.D. ; Cowburn, R.P.

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Focused-ion-beam (FIB) milling has been used to structure magnetic nanoelements from 5 nm thick films of permalloy. We have used focused 30-keV Ga+ ions to define small arrays (6 μm×6 μm) of wires, circles, and elongated hexagons in the size range 100–500 nm. High-sensitivity magneto-optical measurements combined with atomic force microscopy show that very high quality magnetic nanostructures can be fabricated by FIB milling even in thin films of soft magnetic materials. This finding could be significant for the future commercialization of certain aspects of magnetic nanotechnology and magnetoelectronics. © 2001 American Institute of Physics.

Published in:
Applied Physics Letters  (Volume:79 ,  Issue: 21 )

Date of Publication: Nov 2001

Page(s):
3461 - 3463
ISSN :
0003-6951
Digital Object Identifier :
10.1063/1.1419032
Product Type:
Journals & Magazines
Date of Current Version :
18 June 2009
Issue Date :
Nov 2001

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