Referenced Items are not available for this document.
Learning techniques like SOCRATES and recursive learning have greatly enhanced the technology of FAN-based ATPG. In this paper we present a test generation methodology for combinational circuits using functional learning, discuss application of novel functional information to enhance ATPG and present ATPG results on ISCAS 85 benchmark circuits. The test generation methodology combines the use of structural (topology) based analysis methods with the function representation techniques (such as BDDs)
Published in:
VLSI Design, 1996. Proceedings., Ninth International Conference on
Date of Conference: 3-6 Jan 1996
- Page(s):
- 107 - 110
- Meeting Date :
- 03 Jan 1996-06 Jan 1996
- ISSN :
- 1063-9667
- Print ISBN:
- 0-8186-7228-5
- INSPEC Accession Number:
- 5374976
- Conference Location :
- Bangalore
- Digital Object Identifier :
- 10.1109/ICVD.1996.489467
- Product Type:
- Conference Publications
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