On more efficient combinational ATPG using functional learning

Learning techniques like SOCRATES and recursive learning have greatly enhanced the technology of FAN-based ATPG. In this paper we present a test generation methodology for combinational circuits using functional learning, discuss application of novel functional information to enhance ATPG and present ATPG results on ISCAS 85 benchmark circuits. The test generation methodology combines the use of structural (topology) based analysis methods with the function representation techniques (such as BDDs).