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Millimeter-wave scanning near-field microscope using a resonant waveguide probe

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3 Author(s)
Park, Wonkyun ; Department of Physics, Sogang University, C.P.O. 1142, Seoul 121-742, Korea ; Kim, Jooyoung ; Lee, Kiejin

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1409944 

We demonstrate a millimeter-wave surface imaging technique using a near-field scanning millimeter-wave microscope with a resonant standard waveguide probe. The metallic probe tip in the resonant waveguide was designed to couple energy into and out of the resonant waveguide. By measuring the shift of the resonant frequency and the change of the quality factor in the near-field zone, we obtained millimeter-wave near-field images of YBa2Cu3Oy thin films on MgO substrates with a spatial resolution better than 2 μm. © 2001 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:79 ,  Issue: 16 )

Date of Publication:

Oct 2001

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