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Few electrons injection in silicon nanocrystals probed by ultrahigh vacuum atomic force microscopy

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5 Author(s)
Decossas, S. ; LTM/CNRS, CEA/Leti/DTS, 17 av. des Martyrs, F-38054 Grenoble, France ; Vitiello, J. ; Baron, T. ; Mazen, F.
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Ultrahigh vacuum atomic force microscopy has been used to inject and detect charges in individual silicon nanocrystals. The sensitivity of our measurements is shown to be better than 2 e. Injected charge saturates as a function of injection time for a given electric field. The potential of the charged nanocrystal as a function of the number of charges in the dot is in good agreement with a simple electrostatic model.

Published in:

Applied Physics Letters  (Volume:86 ,  Issue: 3 )

Date of Publication:

Jan 2005

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