Close category search window
 

Design and implementation of an adapative single pole autoreclosure technique for transmission lines using artificial neural networks

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Fitton, D.S. ; Sch. of Electron. & Electr. Eng., Bath Univ., UK ; Dunn, R.W. ; Aggarwal, R.K. ; Johns, A.T.
more authors

Adaptive single pole autoreclosure (SPAR) offers many advantages over conventional techniques. In the case of transient faults, the secondary arc extinction time can be accurately determined and in the case of a permanent fault, breaker reclosure can be avoided. This paper describes, in some detail, the design and implementation of a SPAR technique using artificial neural networks (ANNs). The design described includes special methods for extracting features from post-circuit breaker opening fault data, which is a prerequisite for setting up training data sets. The technique is then implemented in hardware based on a high performance T800 transputer system and some results obtained from laboratory tests of this equipment are presented

Published in:
Power Delivery, IEEE Transactions on  (Volume:11 ,  Issue: 2 )

Date of Publication: Apr 1996

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.