Thin TlBa2Ca2Cu3O9+x films were grown on single crystal (110) LaAlO3 from metal-organic chemical-vapor deposition-derived Ba–Ca–Cu–Ox precursor films employing Ba(hfa)2∙mep, Ca(hfa)2∙tet, and Cu(dpm)2 (hfa=hexafluoroacetylacetonate; dpm=dipivaloylmethanate; tet=tetraglyme; mep=methylethylpentaglyme) as the volatile metal sources. Thallination is then accomplished by annealing the precursor films in the presence of a bulk BaO+CaO+CuO+TlF source at 885 °C in flowing O2. The presence of TlF is essential for nucleating the Tl-1223 phase. The resulting Tl-1223 films are nearly phase-pure, highly oriented, epitaxial by x-ray diffraction, and contain negligible fluoride by windowless energy-dispersive x-ray measurements. The films exhibit a transport measured Tc=103 K and Jc=4.4×104 A/cm2 (77 K, 0 T). Magnetic hysteresis measurements yield Jc=1.9×105 A/cm2 (30 K, 0.01 T) and show considerable flux pinning at low temperatures with Jc=1.4×105- - 2009;A/cm2 (5 K, 4.5 T). © 1997 American Institute of Physics.