Cart (Loading....) | Create Account
Close category search window
 

Matching score properties between range profiles of high-resolution radar targets

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Hsueh-Jyh Li ; Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan ; Yung-Deh Wang ; Long-Huai Wang

In this paper, how the statistical properties of the matching scores are affected by the carrier frequency, the aspect variation, the range resolution, and the target complexity are studied. The statistical parameters (mean and standard deviation) of the matching scores among range profiles of independent objects are derived, and their values are used as references to determine the threshold values for target identification. It is found that the range profile obtained at a certain carrier frequency can also be used as the feature vector for radars operated at shifted frequencies if the range resolution is fine enough or the target is simple. It is also found that a radar with higher range resolution can tolerate more aspect variation, yielding a significant advantage in saving memory space for establishing the data base. The results obtained can have several applications such as target identification, data association in multiple target tracking, and target direction determination when widely-spaced high-resolution radars are employed

Published in:

Antennas and Propagation, IEEE Transactions on  (Volume:44 ,  Issue: 4 )

Date of Publication:

Apr 1996

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.