By Topic

Influence of solar cycle on SPOT-1,-2,-3 upset rates

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)

The French SPOT Earth observation system has now been used for more than eight years. A former study had presented results obtained during the first years of service which took place in solar minimum activity conditions. This paper presents the evolution of the upset rate measured on the 1088 1-kbit memories (CMOS SRAMs) of the on-board computer (OBC) throughout minimum and maximum solar activity. Upset rate is well correlated with solar cycle. Little influence of solar flares was observed. Most critical periods are transitions between phases of the solar cycle. Comparison is made with model predictions

Published in:

Nuclear Science, IEEE Transactions on  (Volume:42 ,  Issue: 6 )