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Off-axis reflection zone plate for quantitative soft x-ray source characterization

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6 Author(s)
Wilhein, T. ; Forschungseinrichtung Röntgenphysik, Georg-August Universität Göttingen, D-37073 Göttingen, Germany ; Hambach, D. ; Niemann, B. ; Berglund, M.
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A compact system for high-resolution spectroscopy and quantitative photon flux and brilliance measurements of pulsed soft x-ray sources is described. The calibrated system combines a novel elliptical off-axis reflection zone plate with charge-coupled device detection for simultaneous spectral and spatial measurements. Experiments on a water-window droplet-target laser-plasma source demonstrate λ/Δλ⩾1000 spectral resolution and absolute flux and brilliance measurements. © 1997 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:71 ,  Issue: 2 )