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In this paper we investigate the robustness of Artificial Neural Networks when encountering transient modification of information bits related to the network operation. These kinds of faults are likely to occur as a consequence of interaction with radiation. Results of tests performed to evaluate the fault tolerance properties of two different digital neural circuits are presented
Published in:
Nuclear Science, IEEE Transactions on
(Volume:42
,
Issue:
6
)
Date of Publication: Dec 1995
- Page(s):
- 1856 - 1862
- ISSN :
- 0018-9499
- INSPEC Accession Number:
- 5179751
- Digital Object Identifier :
- 10.1109/23.489227
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 06 August 2002
- Issue Date :
- Dec 1995
- Sponsored by :
- IEEE Nuclear and Plasma Sciences Society
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