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Solution to the bistability problem in shear force distance regulation encountered in scanning force and near-field optical microscopes

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5 Author(s)
Zvyagin, A.V. ; Tokyo Institute of Technology, Nagatsuta 4259, Yokohama 227, Japan ; White, J.D. ; Kourogi, M. ; Kozuma, M.
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The bistability problem, common to scanning microscopes employing lateral dithering of the probe for image formation (i.e., shear force microscope) or probe-sample distance control (i.e., near-field optical microscope) is shown to stem from the two nearly degenerate vibration degrees of freedom possessed by a laterally dithered fiber. Controlling the fiber vibration direction by means of a four-sectioned piezo was found to be a simple and effective solution of the problem. An image of a microtubule is presented to demonstrate the improved imaging ability. © 1997 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:71 ,  Issue: 17 )