Cart (Loading....) | Create Account
Close category search window

Frictional imaging in a scanning near-field optical/atomic-force microscope by a thin step etched optical fiber probe

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Muramatsu, Hiroshi ; Advanced Technology Center, Seiko Instruments Inc., Takatsuka, Matsudo, Chiba 271, Japan ; Chiba, Norio ; Fujihira, Masamichi

Your organization might have access to this article on the publisher's site. To check, click on this link: 

Use of a thin step etched optical fiber probe in a scanning near-field optical/atomic-force microscope (SNOM/AFM) produced frictional imaging. The probe was fabricated by the etching of an optical fiber to decrease its diameter and sharpen the tip end with a HF solution and by irradiating a CO2 laser beam to bend the tip. The spring constant of the thin probe is 100 times smaller than that of a conventional optical fiber probe, which allows the probe to be used as a contact AFM mode and in frictional imaging. © 1997 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:71 ,  Issue: 15 )

Date of Publication:

Oct 1997

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.