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Frictional imaging in a scanning near-field optical/atomic-force microscope by a thin step etched optical fiber probe

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3 Author(s)
Muramatsu, Hiroshi ; Advanced Technology Center, Seiko Instruments Inc., Takatsuka, Matsudo, Chiba 271, Japan ; Chiba, Norio ; Fujihira, Masamichi

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.120446 

Use of a thin step etched optical fiber probe in a scanning near-field optical/atomic-force microscope (SNOM/AFM) produced frictional imaging. The probe was fabricated by the etching of an optical fiber to decrease its diameter and sharpen the tip end with a HF solution and by irradiating a CO2 laser beam to bend the tip. The spring constant of the thin probe is 100 times smaller than that of a conventional optical fiber probe, which allows the probe to be used as a contact AFM mode and in frictional imaging. © 1997 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:71 ,  Issue: 15 )

Date of Publication:

Oct 1997

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