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Comment on “Imaging the local electrical properties of metal surfaces by atomic force microscopy with conducting probes” [Appl. Phys. Lett. 69, 1975 (1996)]

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1 Author(s)
Farley, Andrew N. ; School of Physics, Manchester Metropolitan University, Manchester, M1 5GD, United Kingdom

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Published in:

Applied Physics Letters  (Volume:70 ,  Issue: 26 )