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Temperature dependence of energy gap in GaN thin film studied by thermomodulation

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8 Author(s)
Li, Y. ; Department of Electrical and Computer Engineering, Rutgers, The State University of New Jersey, Piscataway, New Jersey 08855-0909 ; Lu, Y. ; Shen, H. ; Wraback, M.
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The thermomodulation spectrum from metal organic chemical vapor deposition grown GaN has been measured in the temperature range of 20–310 K. A theoretical model is established to explain the spectrum by considering the modulation of dielectric constant and epilayer thickness. It is found that the latter is especially important for a material system with a large difference in refractive indices between the epilayer and the substrate. The band gap energy and broadening parameter are determined using a lineshape analysis. Varshni coefficients of the energy gap are determined. The temperature dependence of broadening parameter is also measured. © 1997 American Institute of Physics.

Published in:
Applied Physics Letters  (Volume:70 ,  Issue: 18 )

Date of Publication: May 1997

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