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Photorefractive damage removal in annealed-proton-exchanged LiNbO3 channel waveguides

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4 Author(s)
Robertson, Elaine E. ; Optoelectronics Research Center and Department of Physics, University of Southampton, United Kingdom ; Eason, R.W. ; Yokoo, Yoshiatsu ; Chandler, Peter J.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.118959 

Ion beam implantation has been used as a postprocessing technique to dramatically reduce the photorefractive effect in lithium niobate channel waveguides. The waveguides were fabricated by proton exchange and then annealed 1.0 MeV H+ ions were implanted through the existing channel waveguides such that the “damaged layer” was created beneath the existing channel waveguide. The output characteristics from the waveguides were subsequently examined. Highly stable single-mode outputs were observed with the waveguides retaining up to 95% of their original transmission. It is thought that this decrease in photorefractive susceptibility can be explained by the implant changing the defect structure and hence photovoltaic properties of the material. © 1997 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:70 ,  Issue: 16 )

Date of Publication:

Apr 1997

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