By Topic

Erratum: “High-resolution x-ray analysis of InGaN/GaN superlattices grown on sapphire substrates with GaN layers” [Appl. Phys. Lett. 69, 3390 (1996)]

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
6 Author(s)
Li, Wei ; Department of Physics and Measurement Technology, Linköping University, S-581 83 Linköping, Sweden ; Bergman, Peder ; Ivanov, Ivan ; Ni, Wei-Xin
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link: 

First Page of the Article

Published in:

Applied Physics Letters  (Volume:70 ,  Issue: 15 )