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Erratum: “High-resolution x-ray analysis of InGaN/GaN superlattices grown on sapphire substrates with GaN layers” [Appl. Phys. Lett. 69, 3390 (1996)]

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6 Author(s)
Li, Wei ; Department of Physics and Measurement Technology, Linköping University, S-581 83 Linköping, Sweden ; Bergman, Peder ; Ivanov, Ivan ; Ni, Wei-Xin
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Applied Physics Letters  (Volume:70 ,  Issue: 15 )