Cart (Loading....) | Create Account
Close category search window

Electric field effect on luminescence efficiency in 8-hydroxyquinoline aluminum (Alq3) thin films

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Stampor, W. ; Department of Molecular Physics, Technical University of Gdańsk, ul. G. Narutowicza 11/12, 80-952 Gdańsk, Poland ; Kalinowski, J. ; Di Marco, P. ; Fattori, V.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

Electric field-induced luminescence quenching in thin films made from common organic electroluminescent material of aluminum (III) 8-hydroxyquinoline (Alq3) is reported. The dependence of luminescence quenching on excitation wavelength and electric field is attributed to field-assisted hopping separation of charge in localized excited states. The effect extrapolated to high electric fields can reduce the luminescence yield by as much as 60% limiting electroluminescence quantum efficiency in high-field-driven light emitting diodes based on the Alq3 emitter. © 1997 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:70 ,  Issue: 15 )

Date of Publication:

Apr 1997

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.