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Analysis of step-stress accelerated-life-test data: a new approach

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4 Author(s)
Tang, L.C. ; Dept. of Ind. & Syst. Eng., Nat. Univ. of Singapore, Singapore ; Sun, Y.S. ; Goh, T.N. ; Ong, H.L.

A linear cumulative exposure model (LCEM) is used to analyze data from a step-stress accelerated-life-test, in particular, those with failure-free life (FFL). FFL is characterized by a location parameter in the distribution. For the 2-parameter Weibull distribution, the Nelson cumulative exposure model is a special case of LCEM. Under LCEM a general expression is derived for computing the maximum likelihood estimator (MLE) of stress-dependent distribution parameters under multiple censoring. The estimation procedure is simple and is illustrated by a set of experimental data using the 3-parameter Weibull distribution

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Reliability, IEEE Transactions on  (Volume:45 ,  Issue: 1 )