Cart (Loading....) | Create Account
Close category search window
 

Accuracy of the single‐electron pump using an optimized step‐like rf drive waveform

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Fonseca, L.R.C. ; Department of Applied Mathematics and Statistics, State University of New York, Stony Brook, New York 11794‐3600 ; Korotkov, A.N. ; Likharev, K.K.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.117457 

We have performed an optimization of those parameters of a single‐electron pump that may influence the accuracy of this device as a standard of dc current. Two types of rf drive were considered: the traditional triangular waveform and a step‐like waveform. We have shown that, after optimization, the accuracy of the pump may be improved considerably in a wide range of drive frequencies, especially at low temperatures, using the step‐like waveform. For example, the error of a five‐junction pump with junction capacitances C=0.1 fF at 100 mK and 10 MHz may be as small as 10-13. © 1996 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:69 ,  Issue: 13 )

Date of Publication:

Sep 1996

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.