Cart (Loading....) | Create Account
Close category search window

Dynamic studies of charge‐separated‐state enhancement of the optical nonlinearity of a porphyrin heterodimer

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Si, Jinhai ; Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100080, People''s Republic of China ; Wang, Yougui ; Yang, Qiguang ; Ye, Peixian
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link: 

Light‐induced enhancement of the third‐order nonlinear optical susceptibility of a heterodimer consisting of two different porphyrin monomers, a zinctetra(4‐sulfonatophenyl)porphyrin and a zinctetra(4‐N‐methyl‐pyridyl)porphyrin, was observed when the sample was optically pumped by a 30 ps, 532 nm pump pulse. The temporal behavior of the enhancement was studied. It was found that the enhancement was due predominantly to the population of the charge‐separated state with a large electronic third‐order nonlinear optical susceptibility © 1996 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:69 ,  Issue: 13 )

Date of Publication:

Sep 1996

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.