Raman scattering was used to characterize BaTiO3/YBa2Cu3O7-x thin film bilayer structure grown by pulsed laser ablation (PLA). The Raman spectra were compared with the x‐ray diffraction (XRD) spectra. The Raman peaks due to the tetragonal phase of BaTiO3 (BTO) and to the 123 phase YBa2Cu3O7-x (YBCO) were observed at room temperature. XRD results showed that the BaTiO3 thin film has highly c‐axis oriented tetragonal phase and is fully epitaxial. However, some impurity phases were observed from the Raman spectrum of the BaTiO3 thin film. © 1996 American Institute of Physics.