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Microstructural dependence of penetration depth of Ag‐doped YBa2Cu3O7-δ thin films probed by atomic force microscopy

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6 Author(s)
Pinto, R. ; Tata Institute of Fundamental Research, Homi Bhabha Road, Bombay 40005, India ; Kaur, Davinder ; Rao, M.S.Ramachandra ; Apte, P.R.
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The magnetic penetration depth λ of laser ablated 5 wt % Ag‐doped YBa2Cu3O7-δ thin films has been measured in the thickness range 1500–4000 Å and in the temperature range 18–88 K using microstrip resonator technique. A correlation of λ(T) with the film microstructure observed with atomic force microscopy has shown that λ(T) depends critically on the film microstructure. © 1996 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:68 ,  Issue: 12 )

Date of Publication:

Mar 1996

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