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Direct visualization of electromagnetic microfields by interference of three electron waves

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3 Author(s)
Hirayama, Tsukasa ; Japan Fine Ceramics Center, 2‐4‐1 Mutsuno, Atsuta‐ku, Nagoya 456, Japan ; Tanji, Takayoshi ; Tonomura, Akira

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A method is presented for direct visualization of electromagnetic microfields. Using a transmission electron microscope equipped with a field‐emission electron gun and two electron biprisms, an object wave and two reference waves are superposed to interfere for producing a new type of interference pattern in which electromagnetic fields are directly observed. Equal‐potential lines of an electric field around a latex particle and magnetic flux lines emerging from a barium ferrite particle have been observed. © 1995 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:67 ,  Issue: 9 )