Cart (Loading....) | Create Account
Close category search window
 

Compression mechanism of picosecond optical pulse in far infrared waveguide free electron laser

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Hu, Suxing ; Shanghai Institute of Optics and Fine Mechanics, Academia Sinica, P.O. Box 800‐211, Shanghai 201800, People’s Republic of China ; Fu, Ensheng

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.114897 

We have investigated the compression mechanism of picosecond optical pulses in a far infrared waveguide free electron laser driven by a radio frequency linear accelerator. With a pertinent waveguide gap b and the required original phase velocity of the electron bunch, the longitudinal length of a picosecond optical pulse will be continuously shortened so that the pulse power increases quickly until saturation occurs. In order to continue the compression process, an optimal cavity detuning ΔLc is necessary. © 1995 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:67 ,  Issue: 23 )

Date of Publication:

Dec 1995

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.